ASAP Semiconductor

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Description

END ITEM IDENTIFICATION: TRACKING STATION,AN/FSQ 114 GENERAL CHARACTERISTICS ITEM DESCRIPTION: DUAL AXIS MEASUREMENT; W/2 MICROMETERS; MEASURING RANGE: 150 FT 1 ARC MINUTE,AT 10 FT 10 ARC MINUTE; FIELD OF VIEW:26 ARC MINUTES; APERTURE:1.800 IN. DIA; FOCAL LG:43.000 IN.; MAGNIFICATION:38X; OCULAR FOCUS RANGE:PORM 5 DIOPTERS; ANTI REFLECTION COATED; SCALE:DIV ARC SEC AND TENTHS ARC SEC; LIGHT SOURCE:VARIABLE INTENSITY 6.0 V LAMP; POWER INPUT:115.0 V,60.0 HZ; O/A LG:18.750 IN.; WT:9 LBS 4 OZ; RETICLE:FILAR BIFILAR; W/CARRYING CASE

Specifications

Part NumberK222
DescriptionEND ITEM IDENTIFICATION: TRACKING STATION,AN/FSQ 114 GENERAL CHARACTERISTICS ITEM DESCRIPTION: DUAL AXIS MEASUREMENT; W/2 MICROMETERS; MEASURING RANGE: 150 FT 1 ARC MINUTE,AT 10 FT 10 ARC MINUTE; FIELD OF VIEW:26 ARC MINUTES; APERTURE:1.800 IN. DIA; FOCAL LG:43.000 IN.; MAGNIFICATION:38X; OCULAR FOCUS RANGE:PORM 5 DIOPTERS; ANTI REFLECTION COATED; SCALE:DIV ARC SEC AND TENTHS ARC SEC; LIGHT SOURCE:VARIABLE INTENSITY 6.0 V LAMP; POWER INPUT:115.0 V,60.0 HZ; O/A LG:18.750 IN.; WT:9 LBS 4 OZ; RETICLE:FILAR BIFILAR; W/CARRYING CASE
ManufacturerContraves Inc

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